[Federal Register Volume 75, Number 139 (Wednesday, July 21, 2010)]
[Notices]
[Pages 42377-42378]
From the Federal Register Online via the Government Printing Office [www.gpo.gov]
[FR Doc No: 2010-17797]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before August 10, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 10-044. Applicant: University of Massachusetts 
Amherst, Biology Department, 611 N. Pleasant St., Amherst, MA 01003. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to provide 3-
dimensional images and support structural analysis using backscattered 
electrons and non-destructive chemical analysis using X-rays. Further, 
this instrument is capable

[[Page 42378]]

of imaging with accelerating voltages as low as 50 V and has a 
resolution limit of 0.9 nm. Justification for Duty-Free Entry: There 
are no instruments of the same general category being manufactured in 
the United States. Application accepted by Commissioner of Customs: 
July 8, 2010.

    Docket Number: 10-047. Applicant: Appalachian State University, 572 
Rivers Street, Boone, NC 28608. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: Samples of plants, 
mouse, fish and optical fibers will be examined. Microtubules of the 
cells, proteins of the tissues and metallic nanostructures will be 
analyzed with the instrument. Justification for Duty-Free Entry: There 
are no instruments of the same general category being manufactured in 
the United States. Application accepted by Commissioner of Customs: 
June 30, 2010.

    Docket Number: 10-048. Applicant: The University of Texas at El 
Paso, 500 West University Ave., El Paso, Texas 79968. Instrument: 
Electron Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: The 
instrument will be used to collect images of highly magnified samples 
of proteins, protein complexes and supra-molecular assemblies such as 
bacteriophages and viruses. These images are then computationally 
processed to generate a 3-dimensional reconstruction of the original 
sample that was imaged in the microscope in only two dimensions. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category being manufactured in the United States. Application 
accepted by Commissioner of Customs: July 1, 2010.

    Docket Number: 10-050. Applicant: Stanford University School of 
Medicine, Board of Trustees of the Leland Stanford Junior University, 
Beckman Center, B001, 279 Campus Drive, Stanford, CA 94305-5301. 
Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: The instrument will be used to discover new genes with 
essential functions in myelination, define new zebrafish models of 
important myelin disorders in humans, and provide new avenues toward 
therapies for myelin repair and prevention of axonal damage after 
demyelination. A reliable electron microscope with digital image 
acquisition is required for the lab's ultrastructural studies of 
myelination. Justification for Duty-Free Entry: There are no 
instruments of the same general category being manufactured in the 
United States. Application accepted by Commissioner of Customs: July 7, 
2010.

    Dated: July 14, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-17797 Filed 7-20-10; 8:45 am]
BILLING CODE 3510-DS-P