[Federal Register Volume 76, Number 159 (Wednesday, August 17, 2011)]
[Notices]
[Pages 50997-50998]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-21005]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before September 6, 2011. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 11-047. Applicant: Ohio State University, School of
Earth Sciences, 275 Mendenhall Laboratory, 125 South Oval Mall,
Columbus, OH 43210. Instrument: Electron Microscope. Manufacturer: FEI
Company, Czech Republic. Intended Use: Several characteristics of the
instrument which are required for the research include an
[[Page 50998]]
automated mineralogy analyzer for analysis and interpretation of major
and trace chemistry, mineral phase matching with rapidly-acquired
energy dispersive x-ray data, the ability to have comprehensive offline
image analysis and x-ray spectral analysis as well as variable vacuum
modes to allow observation of uncoated nonconductive specimens.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: July 27, 2011.
Docket Number: 11-050. Applicant: Southwest Research Institute,
6220 Culebra Rd., San Antonio, TX 78239-5166. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to study bones and other biological
materials to characterize structural features responsible for reduced
fracture strength in osteoporosis and studying the performance of bone
scaffolds for enhancing re-growth of bone into damaged areas. This
instrument has the ability to characterize biological samples at water
vapor pressures up to 2,600 Pa, assuring that artifacts will not
obscure the actual examination of the actual structure and composition,
which is required for the research. The technical specifications for
the SEMs manufactured in the United States by TESCAN listed at
tescan.com indicated that their SEMs had a maximum vapor pressure of
150 Pa, which is well below the level at which moisture will evaporate
from biological samples. Justification for Duty-Free Entry: There are
no instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: July 27, 2011.
Docket Number: 11-052. Applicant: Southern University and A&M
College, 4th Floor, J.S. Clark Building, Baton Rouge, LA 70813.
Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended
Use: Among others, the research topics include the investigation of the
self-healing of structural damage using shape memory polymer based
composites, and the study of electronic based chemical sensors. The
instrument will provide high-resolution capabilities. Justification for
Duty-Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: August 1, 2011.
Docket Number: 11-053. Applicant: University of Texas Health
Science Center--Houston, 6431 Fannin, Houston, TX 77030. Instrument:
Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The
instrument will be used to examine immune-gold labeled biological
specimens and capture high resolution digital images to determine
whether proteins are spatial segregated on the plasma membrane of
mammalian cells. The instrument must be capable of providing high-
resolution and high-contrast images, a stage that is easy to move, a
focus that does not change with changing magnification, and brightness
that changes automatically with magnification. Justification for Duty-
Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: July 29, 2011.
Docket Number: 11-054. Applicant: Battelle Energy Alliance, Idaho
National Laboratory, 2525 North Freemont Ave., Idaho Falls, ID 83415.
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech
Republic. Intended Use: The instrument will be used to analyze nuclear
fuels and materials to make determinations of and produce materials
that have improved performance in advanced reactor systems. Current
U.S. manufactured instruments do not reach the sensitivity level of
this instrument. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: August 3,
2011.
Docket Number: 11-055. Applicant: University of Washington, 1959 NE
Pacific St., Seattle, WA 98195. Instrument: Electron Microscope.
Manufacturer: FEI Company, the Netherlands. Intended Use: The
instrument will be used to study proteins, macromolecular complexes,
viruses, and nanostructured materials to obtain structural information
of biological specimens at the highest achievable resolution.
Justification for Duty-Free Entry: There are no instruments of the same
general category manufactured in the United States. Application
accepted by Commissioner of Customs: August 3, 2011.
Dated: August 11, 2011.
Gregory W. Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-21005 Filed 8-16-11; 8:45 am]
BILLING CODE 3510-DS-P