[Federal Register Volume 78, Number 165 (Monday, August 26, 2013)]
[Notices]
[Page 52760]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2013-20753]
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DEPARTMENT OF COMMERCE
International Trade Administration
Application(s) for Duty-Free Entry of Scientific Instruments
Pursuant to Section 6(c) of the Educational, Scientific and
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments
on the question of whether instruments of equivalent scientific value,
for the purposes for which the instruments shown below are intended to
be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the
regulations and be postmarked on or before September 16, 2013. Address
written comments to Statutory Import Programs Staff, Room 3720, U.S.
Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of
Commerce in Room 3720.
Docket Number: 13-025. Applicant: University of Virginia, Wilsdorf
Hall, P.O. Box 400745, 395 McCormick Drive, Charlottesville, VA 22904-
4745. Instrument: Electron Microscope. Manufacturer: FEI Company, the
Netherlands. Intended Use: The instrument will be used to identify the
different phases in materials such as metals and alloys,
semiconductors, polymers, and biological specimens, as well as the
compositions of certain parts of these materials, the cause of failure
in some, and the morphology and/or crystallography of specimens
fabricated by various processes. The instrument will be used to analyze
the specimens in a high, medium, or low vacuum. Justification for Duty-
Free Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: May 24, 2013.
Docket Number: 13-026. Applicant: Yale University, 850 West Campus
Drive, Bldg. ISTC, Room 213C, West Haven, CT 06516. Instrument:
Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to develop novel platforms based on self-
assembled DNA nanostructures for studying cell biology. DNA
nanostructures will be designed by computer-aided design software, and
the correctly formed nanostructures will be confirmed using the
instrument. Justification for Duty-Free Entry: There are no instruments
of the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: June 3, 2013.
Docket Number: 13-027. Applicant: United States Army Medical
Research Institute of Chemical Defense, 3100 Ricketts Point Road,
Aberdeen Proving Ground, MD 21010-5400. Instrument: Electron
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The
instrument will be used to define the various pathologies associated
with exposure to chemical warfare agents, to define a window of
opportunity for medical intervention and to assess the success of
treatments and countermeasures. The instrument will provide a means of
studying the morphology and ultrastructural pathology/cellular
morphology of and for characterization of the elemental composition of
experimental samples. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: June 19, 2013.
Docket Number: 13-029. Applicant: Arizona State University, P.O.
Box 875212, Tempe, AZ 85287-5212. Instrument: Electron Microscope.
Manufacturer: FEI Company, the Netherlands. Intended Use: The
instrument will be used to observe and understand physical and chemical
processes at the most fundamental atomic level. Phenomena to be studied
will include oxidation, reduction, corrosion and nanoparticle growth.
The instrument will allow time-resolved in situ studies of the dynamic
behavior of nanostructured materials, such as complex oxides and metal
particle catalysts during exposure to reactive gas environments and
elevated temperatures. The instrument is also capable of electron
holography, which is a technique that allows nanoscale electric and
magnetic fields to be measured and quantified with sub-nanometer
resolution. Justification for Duty-Free Entry: There are no instruments
of the same general category manufactured in the United States.
Application accepted by Commissioner of Customs: July 9, 2013.
Docket Number: 13-032. Applicant: Howard Hughes Medical Institute,
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Electron
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use:
The instrument will be used to examine the ultrastructural organization
of complex biological structures to help elucidate the function of
biological specimens such as protein complexes, noninfectious virus,
and small cells. Justification for Duty-Free Entry: There are no
instruments of the same general category manufactured in the United
States. Application accepted by Commissioner of Customs: July 23, 2013.
Docket Number: 13-033. Applicant: University of Pittsburgh School
of Medicine, 3500 Terrace Street, Biomedical Science Tower, S-225,
Pittsburgh, PA 15261. Instrument: Electron Microscope. Manufacturer:
JEOL Ltd., Japan. Intended Use: The instrument will be used to study
viruses, bacteria, cells, tissues, and biomaterials to examine their
ultrastructure, as well as immunologic studies of biological samples
analyzing changes in morphology of particles or tissue or localization
of proteins within cells and tissues. Justification for Duty-Free
Entry: There are no instruments of the same general category
manufactured in the United States. Application accepted by Commissioner
of Customs: July 25, 2013.
Dated: August 15, 2013.
Gregory W. Campbell,
Director of Subsidies Enforcement, Import Administration.
[FR Doc. 2013-20753 Filed 8-23-13; 8:45 am]
BILLING CODE 3510-DS-P