[Federal Register Volume 78, Number 172 (Thursday, September 5, 2013)]
[Notices]
[Page 54625]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2013-21641]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Pacific Northwest National Laboratory, et al.: Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 13-016. Applicant: Pacific Northwest National 
Laboratory, Richland, WA 99352. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 
34990, June 11, 2013.
    Docket Number: 13-018. Applicant: The Scripps Institute, La Jolla, 
CA 92037. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 78 FR 34990, June 11, 2013.
    Docket Number: 13-021. Applicant: University of Massachusetts 
Amherst, Amherst, MA 01003. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd, Japan. Intended Use: See notice at 78 FR 37206-
07, June 20, 2013.
    Docket Number: 13-022. Applicant: University of Utah, Salt Lake 
City, UT 84132. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
    Docket Number: 13-024. Applicant: University of Pennsylvania, 
Biomedical Research Building, Philadelphia, PA 19104. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: See notice at 78 FR 34990-91, June 11, 2013.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: August 27, 2013.
Richard Herring,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-21641 Filed 9-4-13; 8:45 am]
BILLING CODE 3510-DS-P