[Federal Register Volume 78, Number 246 (Monday, December 23, 2013)]
[Notices]
[Pages 77424-77425]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2013-30568]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Virginia, et al.; Notice of Consolidated Decision 
on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 13-025. Applicant: University of Virginia, 
Charlottesville, VA 22904-4745. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
78 FR 52760, August 26, 2013.
    Docket Number: 13-026. Applicant: Yale University, 850 West Haven, 
CT 06516. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., 
Japan. Intended Use: See notice at 78 FR 52760, August 26, 2013.
    Docket Number: 13-027. Applicant: United States Army Medical 
Research Institute of Chemical Defense, Aberdeen Proving Ground, MD 
21010-5400. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., 
Japan. Intended Use: See notice at 78 FR 52760, August 26, 2013.
    Docket Number: 13-029. Applicant: Arizona State University, Tempe, 
AZ 85287-5212. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 78 FR 52760, 
August 26, 2013.
    Docket Number: 13-032. Applicant: Howard Hughes Medical Institute, 
Chevy Chase, MD 20815. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 78 FR 52760, 
August 26, 2013.
    Docket Number: 13-033. Applicant: University of Pittsburgh School 
of Medicine, Pittsburgh, PA 15261. Instrument: Electron Microsocpe. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 78 FR 
52760, August 26, 2013.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.


[[Page 77425]]


     Dated: December 17, 2013.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2013-30568 Filed 12-20-13; 8:45 am]
BILLING CODE 3510-DS-P