[Federal Register Volume 79, Number 81 (Monday, April 28, 2014)]
[Notices]
[Pages 23326-23327]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2014-09606]


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DEPARTMENT OF COMMERCE

International Trade Administration


Max Planck Florida Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC
    Docket Number: 13-031. Applicant: Max Planck Florida Institute, 
Jupiter, FL 33458. Instrument: Field Emission Gun-Scanning Electron 
Microscope. Manufacturer: Carl Zeiss Microscopy, Germany. Intended Use: 
See notice at 79 FR 3178, January 17, 2014.

    Docket Number: 13-042. Applicant: University of Washington Medical 
Center, Seattle, WA 98195-6100. Instrument: Transmission Electron 
Microscope-system type: Tecnai G2 Spirit BioTWIN. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 79 FR 3178, 
January 17, 2014.

    Docket Number: 13-044. Applicant: University of Minnesota-Twin 
Cities, Minneapolis, MN 55455. Instrument: Ultrafast Transmission 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: See notice at 79 FR 3178-79, January 17, 2014.

    Docket Number: 13-045. Applicant: Embry-Riddle Aeronautical 
University, Daytona Beach, FL 32114. Instrument: Scanning Electron 
Microscope Quanta 50 with Energy-Dispersive X-Ray Spectroscopy. 
Manufacturer: FEI Company, Czech Republic. Intended

[[Page 23327]]

Use: See notice at 79 FR 3178-79, January 17, 2014.

    Docket Number: 13-046. Applicant: UT-Battelle, LLC for the 
Department of Energy, Oak Ridge, TN 37831-6138. Instrument: JEM-2100F 
Field Emission Transmission Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 79 FR 3178-79, January 17, 
2014.

    Docket Number: 13-047. Applicant: The Scripps Research Institute, 
La Jolla, CA 92037. Instrument: Transmission Electron Microscope-Talos. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
79 FR 3178-79, January 17, 2014.
    Docket Number: 13-049. Applicant: The Regents of the University of 
Michigan, Ann Arbor, MI 48109. Instrument: Titan Krios Transmission 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: See notice at 79 FR 3178-79, January 17, 2014.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: April 21, 2014.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2014-09606 Filed 4-25-14; 8:45 am]
BILLING CODE 3510-DS-P