[Federal Register Volume 79, Number 87 (Tuesday, May 6, 2014)]
[Notices]
[Pages 25831-25832]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2014-10355]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before May 27, 2014. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 14-006. Applicant: Columbia University, 500 West 120 
St., Suite 200, New York, NY 10027. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to obtain bright-field and dark-field images of 
materials microstructures, to do high resolution lattice imaging, to 
obtain diffraction patterns to identify crystalline phases, to 
determine what elements are in a particular phase using the energy 
dispersive spectrometer, and to obtain atomic number contrast, or Z-
contrast, images using the high angle annular dark field detector. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: April 15, 2014.
    Docket Number: 14-007. Applicant: University of California, Davis, 
One Shields Ave., Davis, CA 95616. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to execute damage free and contamination free preparation 
of high quality samples such as metals, ceramics, metal/ceramic 
interfaces, and polymers for subsequent in situ

[[Page 25832]]

transmission electron microscopy investigations. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: April 14, 2014.
    Docket Number: 14-008. Applicant: California Institute of 
Technology, 1200 E. California Blvd., MC 213-15, Pasadena, CA 91125. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to conduct nano-
mechanical experiments like tension, compression, and bending, 
lithiation-delithiation experiments on battery electrodes, and nano-
tensile deformation of metallic glass nano pillars. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: April 3, 2014.
    Docket Number: 14-010. Applicant: Dana Farber Cancer Institute, 450 
Brookline Ave., Boston, MA 02215. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to study the three-dimensional structure of 
biomolecules such as proteins, nucleic acids, carbohydrates and/or 
lipids to assist our understanding of how they perform and their 
function. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: April 15, 2014.

     Dated: April 29, 2014.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2014-10355 Filed 5-5-14; 8:45 am]
BILLING CODE 3510-DS-P