[Federal Register Volume 73, Number 127 (Tuesday, July 1, 2008)]
[Notices]
[Pages 37408-37409]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-14759]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before July 21, 2008. Address 
written comments to Statutory Import Programs Staff, Room 2104, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 2104.
    Docket Number: 08-027. Applicant: The Ohio State University, 
Materials Science and Engineering, 2041 College Rd., Columbus, OH 
43210. Instrument: Electron Microscope, Model Helios 600. Manufacturer: 
FEI Company/Philips Electron Optics, the Netherlands. Intended Use: The 
instrument is intended to be used to study different types of solid 
state materials. It will be used for general morphological and 
structural studies of ceramics and metals, including high-temperature 
superconductors, high-temperature metal alloys, corrosion mitigation 
coatings, evaporated metal films, silicongermanium and II-V infra-red 
detectors, quantum dots, geological materials, polymers and possibly 
some biological samples. A unique characteristic of this instrument is 
that it is a Dual Beam instrument, i.e., this instrument is a combined 
Focused Ion Beam (FIB) and Scanning Electron Microscope. Application 
accepted by Commissioner of Customs: June 5, 2008.
    Docket Number: 08-029. Applicant: Vanderbilt University, Center for 
Structural Biology, 465 21st Ave. South, MRB III, Suite 5140, 
Nashville, TN 37232-8725. Instrument: Electron Microscope, Model Tecnai 
G\2\ F20 TWIN. Manufacturer: FEI Company, the Netherlands. Intended 
Use: The instrument is intended to be used to study purified biological 
macromolecular complexes. The instrument will be used to examine the 
three dimensional structures of these

[[Page 37409]]

complexes. Application accepted by Commissioner of Customs: June 13, 
2008.
    Docket Number: 08-030. Applicant: University of Washington, 117 
Fluke Hall, Nanotech User Facility, Center for Nanotechnology, Seattle, 
WA 98195. Instrument: Electron Microscope, Model Tecnai G\2\ F20 S-
TWIN. Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument is intended to be used to examine biological, biomimetic, 
hybrid and polymeric materials as well as more traditional materials 
such as metals, alloys, ceramics, composites and electronic materials. 
The instrument will be used to understand the correlations between 
materials' structures and properties at the highest resolution possible 
and to investigate the novel interactions and assembles between 
traditional low-dimensional materials and biological materials. 
Application accepted by Commissioner of Customs: June 13, 2008.

    Dated: June 24, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-14759 Filed 6-30-08; 8:45 am]
BILLING CODE 3510-DS-M